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RIS citation export for FR1A02: Bunch Length Measurements using Transverse Deflecting Systems

AU  - Hüning, M.
ED  - Schaa, Volker RW
ED  - Pei, Guoxi
ED  - Chin, Yong Ho
ED  - Fu, Shinian
ED  - Zhao, Ning
TI  - Bunch Length Measurements using Transverse Deflecting Systems
J2  - Proc. of LINAC2018, Beijing, China, 16-21 September 2018
CY  - Beijing, China
T2  - Linear Accelerator Conference
T3  - 29
LA  - english
AB  - Shorter and shorter bunch lengths (some 10 fs) require sophisticated bunch length measurent devices. Free electron lasers - but not only - use transverse deflecting systems. Employing suitable diagnostic tools measurements are not limited to bunch lengths but can be extended to longitudinal profiles and phase-space distributions, and slice emittances. Not only do successfully operated systems aid the commissioning and operation of FELs but they allow control over more sophisticated phase-space manipulations. The design and construction of such systems, actually operated at different RF frequencies, includes cavity design and fabrication, powerful RF systems, low level RF control, beam lines, diagnostics, and data analysis.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 972
EP  - 976
KW  - diagnostics
KW  - electron
KW  - emittance
KW  - beam-diagnostic
DA  - 2019/01
PY  - 2019
SN  - 2226-0366
SN  - 978-3-95450-194-6
DO  - DOI: 10.18429/JACoW-LINAC2018-FR1A02
UR  - http://jacow.org/linac2018/papers/fr1a02.pdf
ER  -